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    A Statistical Model for Analyzing the Lifetime Cost of Chinese Patents
    A Statistical Model for Analyzing the Lifetime Cost of Chinese Patents
    The author has conducted a study investigating how a company's internal reviews and CNIPA examinations affect the lifetime cost of Chinese patents. A statistical model based on the Lognormal distribution of patent value and supported by empirical data was proposed to analyze the influences. The study considers all costs incurred throughout the innovation stage to the end of patent life. The findings suggest that the lifetime cost of a good patent can be minimized by a particular combination of the internal pass rate and the official grant rate.


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